Yield Engineer-Statistician, Senior or above - Qualcomm｜Meet.jobs

Job Overview
Job Function Candidate will be part of a team of yield engineers in Taiwan to improve and maintain product yields of logic, RF, analog, and power management integrated circuit products using statistical data analysis. The position requires hands-on technical analysis work and working with external foundries, bump facilities, or test sites.

Minimum Qualifications
General: Minimum 5 years experience in process integration, device engineering, and/or process development in wafer fab. Knowledge of DFT, device physics, reliability failure mechanisms, process integration (with Fin-FET process integration experience is a plus) Yield Engineering: Experience using yield and defect models, volume diagnostics methodology, commonality analysis, line segmentation, cluster analysis, random/systematic yield analysis, limited yield partitioning, and yield forecasting. Semiconductor Wafer Metrology: Understanding of fab metrology methods including defect inspection technique, and physical, chemical and electrical characterization methodologies. Statistics: Trained in statistics, statistical process control, design of experiments, and variation analysis in academic or industrial setting. Anova, non-linear multiple factor regression, sweet spot projection, and bi-mode data analysis. Training in response surface methodology, principal components analysis, and time series analysis a plus. Experience using SAS, JMP, Minitab, DataPower(VSF), Spotfire, or Yield Explorer software also a plus. Automation: Skill on scripting (C#, TCL, python) is a plus. Communication: Excellent communication in English is a must. Able to condense information concisely for executive management but also able to communicate highly detailed information to engineers in organized, logical framework.

Preferred Qualifications:NA
Education Requirements:LI-APAC for APAC
Master's or Doctorate degree in Statistics, or strong statistics knowledge in Electrical Engineering, Physics, industrial Engineering.

Keywords:yield, semiconductor, process, wafer sort, inline inspection, volume diagnostics, statistician, statistical, scripting, automation.